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Author (up) Araneda, A.; Sanhueza, V.; Bennun, L. pdf  doi
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  Title Simplified Calibration for Total-Reflection X-ray Fluorescence Type Journal Article
  Year 2016 Publication Analytical Letters Abbreviated Journal Anal. Lett.  
  Volume 49 Issue 11 Pages 1711-1721  
  Keywords Metrology; total-reflection X-ray fluorescence; TXRF calibration; TXRF sensitivity curve  
  Abstract The usual method to determine the relative sensitivity curve for total-reflection X-ray fluorescence (TXRF) uses multielemental solutions, which may be purchased or prepared in the laboratory. In the former case, the accuracy and precision of the concentrations are certified by the provider, while in the latter, the experience of the technical staff determines the analytical quality. These procedures are costly and the quality of the solutions cannot be easily verified. The goal of this work was to use pure crystalline salts containing two elements that may be quantified by TXRF for the calibration of the spectrometer. The analysis of these samples along with a mathematical procedure assures good precision of the results. The reported method is economically efficient, simple, and eliminates the uncertainties of the element concentration in the samples produced by the standard methods, thereby improving the quality of TXRF results.  
  Address [Araneda, Axel] Adolfo Ibanez Univ, Fac Engn & Sci, Santiago, Chile, Email: lbennun@udec.cl  
  Corporate Author Thesis  
  Publisher Taylor & Francis Inc Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0003-2719 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000378755300006 Approved no  
  Call Number UAI @ eduardo.moreno @ Serial 639  
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