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Author (up) Araneda, A.; Sanhueza, V.; Bennun, L.
Title Simplified Calibration for Total-Reflection X-ray Fluorescence Type
Year 2016 Publication Analytical Letters Abbreviated Journal Anal. Lett.
Volume 49 Issue 11 Pages 1711-1721
Keywords Metrology; total-reflection X-ray fluorescence; TXRF calibration; TXRF sensitivity curve
Abstract The usual method to determine the relative sensitivity curve for total-reflection X-ray fluorescence (TXRF) uses multielemental solutions, which may be purchased or prepared in the laboratory. In the former case, the accuracy and precision of the concentrations are certified by the provider, while in the latter, the experience of the technical staff determines the analytical quality. These procedures are costly and the quality of the solutions cannot be easily verified. The goal of this work was to use pure crystalline salts containing two elements that may be quantified by TXRF for the calibration of the spectrometer. The analysis of these samples along with a mathematical procedure assures good precision of the results. The reported method is economically efficient, simple, and eliminates the uncertainties of the element concentration in the samples produced by the standard methods, thereby improving the quality of TXRF results.
Address [Araneda, Axel] Adolfo Ibanez Univ, Fac Engn & Sci, Santiago, Chile, Email: lbennun@udec.cl
Corporate Author Thesis
Publisher Taylor & Francis Inc Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0003-2719 ISBN Medium
Area Expedition Conference
Notes WOS:000378755300006 Approved
Call Number UAI @ eduardo.moreno @ Serial 639
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Author (up) Navarro, H.; Marco, L.M.; Araneda, A.A.; Bennun, L.
Title Spatial distribution of Si in Pinus Insigne (Pinus radiata) Wood using micro XRF by Synchrotron Radiation Type
Year 2019 Publication Journal Of Wood Chemistry And Technology Abbreviated Journal J. Wood Chem. Technol.
Volume 39 Issue 3 Pages 187-198
Keywords Dendrochemical study; Pinus insigne; silicon content; synchrotron radiation; mu XRF
Abstract Silicon, while not an essential element, is known to have positive roles in certain vegetable species. For instance, it has been recognized to protect them from biotic and abiotic stress. Due to the fact that certain species accumulate the aforementioned element in their tissues, the determination of its concentration is of importance in different disciplines, such as dendrology, plant physiology, forest management, agroecology, and also in the wood industry. Usually, its quantification is preceded by a series of digestion steps that, aside from been time-consuming, and contamination-prone, prevents from conducting a spatial distribution of the element on the sample. In this research, samples of Pinus radiata wood were studied using a synchrotron radiation source that allowed direct scanning of its surface without any treatment, and the determination of silicon as a function of the position and the tree rings, using micro X-ray fluorescence (mu XRF). A quantification method based in the fundamental parameters approach was evaluated. It was found that silicon concentration increases near the latewood ring zones, showing a periodical behavior, related to seasonal environmental events.
Address [Navarro, Henry] Univ Nacl Cuyo, Inst Balseiro, San Carlos De Bariloche, Rio Negro, Argentina, Email: lbennun@udec.cl
Corporate Author Thesis
Publisher Taylor & Francis Inc Place of Publication Editor
Language English Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 0277-3813 ISBN Medium
Area Expedition Conference
Notes WOS:000467859800004 Approved
Call Number UAI @ eduardo.moreno @ Serial 1000
Permanent link to this record