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Author Beltran, J.F.; Nunez, E.; Nunez, F.; Silva, I.; Bravo, T.; Moffat, R. pdf  doi
  Title Static response of asymmetrically damaged metallic strands: Experimental and numerical approach Type
  Year 2018 Publication Construction And Building Materials Abbreviated Journal Constr. Build. Mater.  
  Volume 192 Issue Pages 538-554  
  Keywords Asymmetric damaged strands; Surface damage; Numerical model; Finite element simulation; Experimental test; Static capacity curve  
  Abstract In this study, the effect of the presence of broken wires (damage) asymmetrically distributed on metallic strands surfaces on their static response is assessed. To this end, a general mechanical model for multi layered strands is presented, in which damaged strands are treated as a 1D nonlinear beam under uncoupled biaxial bending and axial load (NLBM). The NLBM is validated by comparisons with the results obtained from an experimental program especially designed for studying the effect of surface damage distribution on strands response and 3D nonlinear finite element simulations. Analyses are carried out on two strand constructions: 1 x 7 and 1 x 19, in which the damage levels and strand diameters vary from 5% to 40% and from 3.5 mm to 22.2 mm, respectively. Results indicate that the NLBM accurate predicts the static response (residual strength, stiffness, axial strain field, and deformed configuration) of the asymmetrically damaged strands, achieving good computational efficiency and numerical robustness. (C) 2018 Elsevier Ltd. All rights reserved.  
  Address [Felipe Beltran, Juan] Univ Chile, Dept Civil Engn, Blanco Encalada 2002 Of 440, Santiago, Chile, Email:;  
  Corporate Author Thesis (up)  
  Publisher Elsevier Sci Ltd Place of Publication Editor  
  Language English Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0950-0618 ISBN Medium  
  Area Expedition Conference  
  Notes WOS:000453494600046 Approved  
  Call Number UAI @ eduardo.moreno @ Serial 953  
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