Araneda, A., Sanhueza, V., & Bennun, L. (2016). Simplified Calibration for Total-Reflection X-ray Fluorescence. Anal. Lett., 49(11), 1711–1721.
Abstract: The usual method to determine the relative sensitivity curve for total-reflection X-ray fluorescence (TXRF) uses multielemental solutions, which may be purchased or prepared in the laboratory. In the former case, the accuracy and precision of the concentrations are certified by the provider, while in the latter, the experience of the technical staff determines the analytical quality. These procedures are costly and the quality of the solutions cannot be easily verified. The goal of this work was to use pure crystalline salts containing two elements that may be quantified by TXRF for the calibration of the spectrometer. The analysis of these samples along with a mathematical procedure assures good precision of the results. The reported method is economically efficient, simple, and eliminates the uncertainties of the element concentration in the samples produced by the standard methods, thereby improving the quality of TXRF results.
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Navarro, H., Marco, L. M., Araneda, A. A., & Bennun, L. (2019). Spatial distribution of Si in Pinus Insigne (Pinus radiata) Wood using micro XRF by Synchrotron Radiation. J. Wood Chem. Technol., 39(3), 187–198.
Abstract: Silicon, while not an essential element, is known to have positive roles in certain vegetable species. For instance, it has been recognized to protect them from biotic and abiotic stress. Due to the fact that certain species accumulate the aforementioned element in their tissues, the determination of its concentration is of importance in different disciplines, such as dendrology, plant physiology, forest management, agroecology, and also in the wood industry. Usually, its quantification is preceded by a series of digestion steps that, aside from been time-consuming, and contamination-prone, prevents from conducting a spatial distribution of the element on the sample. In this research, samples of Pinus radiata wood were studied using a synchrotron radiation source that allowed direct scanning of its surface without any treatment, and the determination of silicon as a function of the position and the tree rings, using micro X-ray fluorescence (mu XRF). A quantification method based in the fundamental parameters approach was evaluated. It was found that silicon concentration increases near the latewood ring zones, showing a periodical behavior, related to seasonal environmental events.
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