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Leiva, V.; Liu, S.Z.; Shi, L.; Cysneiros, F.J.A. Diagnostics in elliptical regression models with stochastic restrictions applied to econometrics 2016 Journal Of Applied Statistics 43 627-642 details   pdf doi
Barros, M.; Galea, M.; Leiva, V.; Santos-Neto, M. Generalized Tobit models: diagnostics and application in econometrics 2018 Journal Of Applied Statistics 45 145-167 details   pdf doi
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